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Dr. R. Fabian W. Pease Receives International Society for Quality Electronic Design’s 2011 Quality Award

San Jose, Calif. – 16 March 2011 - The International Society for Quality Electronic Design today announced the winner of the 2011 prestigious Quality Award (IQ-Award 2011). Dr. R. Fabian W. Pease, William Ayer Professor (Emeritus) of Electrical Engineering of Stanford University is this year’s IQ-Award recipient. Dr. Pease is well known as a pioneer in high resolution patterning technologies, high performance thermal management, and scanning electron microscopy for microelectronics. His work has been recognized internationally through numerous major awards, including IEEE Paul Rappaport Award, IEEE Cledo Brunetti Award, and Richard P. Feynman Prize for Microfabrication. Dr. R. Fabian W. Pease was honored during the International Symposium for Quality Electronic Design (ISQED2011) luncheon on Tuesday, March 15.

The Quality Award, also known as the IQ-Award, was established in 2007 to recognize individuals who have made significant and often lasting contributions to the field of quality in electronic design. The award recipients are selected from a pool of qualified candidates from various disciplines encompassing the field of electronic design such as: circuit and system design, design automation, semiconductor technology, IC packaging, test, as well as management/leadership/education fostering the spirit of quality by instilling and promoting quality in electronic design.

ISQED2011 is being held from March 14 to March 16 of 2011 at the Hyatt Regency Hotel, Santa Clara, California. The conference features full day tutorials, embedded tutorials, panel discussions, seven keynote speeches, exhibits, and over 100 technical presentations.



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